- In lower nodes
with increasing process, voltage, and temperature variations across the
same die, arriving at a single Global derate number is
difficult.
- OCV analysis
results in reduced design performance, and longer timing closure cycles
- AOCV on the
other hand uses intelligent techniques for specific derating instead
of a single global derate value
- AOCV provides a
solution for longer timing closure, reduced design performance that caused
with OCV analysis.
- In AOCV analysis
variable values are used for derating timing paths
- Derate values
are functions of Logic depth and/or net and cell location
Using silicon data from test-chips
Advanced OCV computes the length of the diagonal of the bounding box. Based on
the length calculated appropriate derate
value is picked from the AOCV table.
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